Jan 17, 2025
PRODUCT DISPLAY
BACKGROUND
Why develop PT300 when we already have PT200? Because it's a step up!
PT200:
With the expansion of the company's business, more diverse demands and higher performance requirements emerge, making the PT200 series unable to meet them.
TARGET
Taking Smartware and Micropross as benchmarks,
Create a brand new product line of readers and testers with matching
functions and performance
FEATURES
-The SoC platform combines Arm and FPGA. It uses AMD (Xilinx) chip
-Dual-core Cortex A9, Main frequency 766MHz, 1GB of memory, 4GB of electronic hard disk.
- Unique advantage of FPGA: parallel testing, with a 10-fold speed improvement.
√ Contact testing: open/short circuit testing, leakage current testing, static and dynamic current testing, input voltage threshold testing.
√ Contactless testing: capacitance testing, Q value testing, resonant frequency testing, ATT testing.
√ Multiple parameters are adjustable.
√ Contactless power amplification.
Unified product form, flexible combination, excellent expandability, and interface size compatible with PT200.
READER APPLICATIONS
SUITABLE MATERIALS
PT300 SERIES READER
MODULAR DESIGN
PT300 SERIES READER
Function:
√ Open/Short test
√ ATR test
√ C7 IO Pull up resistor setting
√ CLASS A B C D
√ Supporting protocols: ISO7816-3:T=0,T=1 I2C,SPI,UART protocol Private protocols
√ Adjustable parameters (VCC, frequency, rate, etc.)
Improvement:
√ Independently developed ISO7816 protocol
√ Support multiple protocols and smaller interface size
√ True multi interface parallelism
√ C1 wide voltage range, higher current
√ Protective enhancement
√ Scalability
Function:
√ ATS test
√ Supporting protocols: ISO14443A/B,MIFARE,FeliCa,ISO15693
√ Adjustable parameters (RF power)
√ Contactless card signal quality assessment
Improvement:
√ True multi interface parallelism
√ RF power amplification and adjustable
√ Scalability
Function:
√ Contactless function
√ Contact function
Improvement:
√ Integrated contact+contactless
√ Smaller width
Function:
√ Open/Short test, leakage current test
√ Static current and dynamic current test
√ FVMI, FIMV
√ Input level threshold test(Vih,Vil)
√ C7 IO Drive capability testing
√ ATR test
√ C7 IO Pull up resistor gear can be set
√ CLASS A B C D
√ Supporting protocols: ISO7816-3:T=0,T=1 I2C,SPI,UART protocol Private protocols
√ Adjustable parameters (VCC, frequency, rate, etc.)
Improvement:
√ Independently developed ISO7816 protocol
√ Support multiple protocols
√ C1 Wide voltage range, higher current
√ More testing functions
√ Protective enhancement
√ Scalability
Function:
√ Chip capacitance test
√ Q value, resonant frequency, load modulation
√ ATS test
√ Supporting protocols:ISO14443A/B,Mifare,Mifare+,Felica,ISO15693
√ Adjustable parameters:RF power, card Perso rate
√ Contactless card signal quality assessment
Improvement:
√ Capacitance algorithm
√ Calibration algorithm
√ RF design
√ Wireless measurement technology
√ Scalability
PT300 RACK SERIES
PT300 Rack Series Maximal Capacity
TT30 EVALUATION KIT SERIES
SOFTWARE
PART
APPLICATION EQUIPMENT
TECHNICAL SPECIFICATIONS
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