PT300 Series Reader and Tester Introduction

Jan 17, 2025

PRODUCT DISPLAY



BACKGROUND

Why develop PT300 when we already have  PT200? Because it's a step up!

PT200:

  • Incomplete product line: Lack of contactless  performance test
  • Slow testing speed: Performance test - 2s
  • Not widely compatible with materials
  • Insufficient performance
  • No serialization,  No standardization
  • Insufficient scalability

With the expansion of the company's business, more diverse demands and higher performance requirements  emerge, making the PT200 series unable to meet them.



TARGET

Taking Smartware and Micropross as benchmarks,

Create a brand new product line of readers and testers with matching

functions and performance



FEATURES

  • A more advanced platform!

-The SoC platform combines Arm and FPGA. It uses AMD (Xilinx) chip

-Dual-core Cortex A9, Main frequency 766MHz, 1GB of memory, 4GB of electronic hard disk.

  • Faster test speed.

- Unique advantage of FPGA: parallel testing, with a 10-fold speed improvement.

  • More powerful functions.

√ Contact testing: open/short circuit testing, leakage current testing, static and dynamic current testing, input  voltage threshold testing.

√ Contactless testing: capacitance testing, Q value testing, resonant frequency testing, ATT testing.

√ Multiple parameters are adjustable.

√ Contactless power amplification.

  • Standardized and modular design.

Unified product form, flexible combination, excellent expandability, and interface size compatible with PT200.



READER APPLICATIONS



SUITABLE MATERIALS

PT300 SERIES READER



MODULAR DESIGN



PT300 SERIES READER

Function:

√ Open/Short test

√ ATR test

√ C7 IO Pull up resistor setting

√ CLASS A B C D

√ Supporting protocols:  ISO7816-3:T=0,T=1  I2C,SPI,UART protocol  Private protocols

√ Adjustable parameters (VCC, frequency, rate, etc.)

Improvement:

√ Independently developed ISO7816 protocol

√ Support multiple protocols and smaller interface size

√ True multi interface parallelism

√ C1 wide voltage range, higher current

√ Protective enhancement

√ Scalability



Function:

√ ATS test

√ Supporting protocols:  ISO14443A/B,MIFARE,FeliCa,ISO15693

√ Adjustable parameters (RF power)

√ Contactless card signal quality assessment

Improvement:

√ True multi interface parallelism

√ RF power amplification and adjustable

√ Scalability



Function:

√ Contactless function

√ Contact function

Improvement:

√ Integrated contact+contactless

√ Smaller width



Function:

√ Open/Short test, leakage current test

√ Static current and dynamic current test

√ FVMI, FIMV

√ Input level threshold test(Vih,Vil)

√ C7 IO Drive capability testing

√ ATR test

√ C7 IO Pull up resistor gear can be set

√ CLASS A B C D

√ Supporting protocols:  ISO7816-3:T=0,T=1  I2C,SPI,UART protocol  Private protocols

√ Adjustable parameters (VCC, frequency, rate, etc.)

Improvement:

√ Independently developed ISO7816 protocol

√ Support multiple protocols

√ C1 Wide voltage range, higher current

√ More testing functions

√ Protective enhancement

√ Scalability



Function:

√ Chip capacitance test

√ Q value, resonant frequency, load modulation

√ ATS test

√ Supporting protocols:ISO14443A/B,Mifare,Mifare+,Felica,ISO15693

√ Adjustable parameters:RF power, card Perso rate

√ Contactless card signal quality assessment

Improvement:

√ Capacitance algorithm

√ Calibration algorithm

√ RF design

√ Wireless measurement technology

√ Scalability



PT300 RACK SERIES

PT300 Rack Series Maximal Capacity

TT30 EVALUATION KIT SERIES



SOFTWARE

  • Compatible with different models of  readers
  • Support multi head testing of  readers of the same model
  • Support "solution based"  expansion development (requires  cooperation in providing control  software communication protocols)



PART



APPLICATION EQUIPMENT



TECHNICAL SPECIFICATIONS

RSID-Solutions Launches Multi-Language Corner to Enhance Employee Language Skills
RSID Solutions Successfully Complete Installation and Training of Second Inlay Production Line in the Americas